Showing 1-7 of 7 results
- Sort
Sort By
Results
Using TEM Cell Measurements to Estimate the Maximum Radiation From PCBs With Cables Due to Magnetic Field Coupling
Common-mode currents can be induced on cables attached to printed circuit boards (PCBs) due to electric and magnetic field coupling. This paper describes a technique for using transverse electromagnetic (TEM) cell measurements to obtain an effective common-mode voltage (or magnetic moment) that quantifies the ability of traces and integrated circuits on PCBs to drive common-mode currents onto cabl...Show More
An Experimental Investigation of Higher Order Mode Suppression in TEM Cells
Transverse electromagnetic (TEM) cells can be used to evaluate the electric and magnetic fields coupling from integrated circuits (ICs). The propagation and reflection of higher order modes in the cells limits the bandwidth of TEM cells. This paper investigates several methods for suppressing higher order modes in TEM cells in order to extend the applicable frequency range without changing the tes...Show More
Estimating Maximum Radiated Emissions From Printed Circuit Boards With an Attached Cable
The common-mode current induced on cables attached to printed circuit boards can be a significant source of radiated emissions. Previous studies have shown that coupling from electric and magnetic field sources on circuit boards can be effectively modeled by placing equivalent voltage sources between the board and the cable. The amplitude of these equivalent sources can be estimated by using close...Show More
Characterizing the Electric Field Coupling from IC Heatsink Structures to External Cables Using TEM Cell Measurements
One method for evaluating the unintentional radiated emissions from integrated circuits (ICs) involves mounting the IC on a printed circuit board (PCB) embedded in the wall of a transverse electromagnetic (TEM) cell. The signal voltages on the IC and its package produce electric fields that can couple to cables and other structures attached to the PCB, inducing common-mode currents that can be a p...Show More
Mode Suppressed TEM Cell Design For High Frequency IC Measurements
Shaowei Deng;David Pommerenke;Todd Hubing;J. Drewniak;Daryl Beetner;Dongshik Shin;Sungnam Kim;Hocheol Kwak
2007 IEEE International Symposium on Electromagnetic Compatibility
Year: 2007 | Conference Paper |
Cited by: Papers (8)
TEM cells or GTEM cells can be used to evaluate the radiated emissions of integrated circuits (ICs). The applicable frequency bandwidth of a TEM cell is limited due to the resonances of higher order modes. This paper describes how a TEM cell can be modified to extend the frequency range without changing the test topology. Several methods are proposed and implemented to suppress the higher order mo...Show More
Analysis of chip-level EMI using near-field magnetic scanning
2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559)
Year: 2004 | Conference Paper |
Cited by: Papers (30)
Integrated circuits (ICs) are often a significant source of radiated energy from electronic systems. Well designed ICs maintain good control of the currents that they generate. However, poorly designed ICs can drive high-frequency noise currents onto nominally low-frequency input and output pins. These currents can excite unintentional radiating structures on the printed circuit board, resulting i...Show More
IEEE Account
Purchase Details
Profile Information
Need Help?
- US & Canada: +1 800 678 4333
- Worldwide: +1 732 981 0060
- Contact & Support
- About IEEE Xplore
- Contact Us
- Help
- Accessibility
- Terms of Use
- Nondiscrimination Policy
- Sitemap
- Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.