Guowei Xue - IEEE Xplore Author Profile

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Author details

Guowei Xue

Publications

3

Citations

0

Publications by Year

20102010

Co-Authors:

Yan Zhang

Guowei Xue

Affiliation

Key Laboratory of Network Oriented Intelligent Computation

Shenzhen Graduate School

Harbin Institute of Technology, Shenzhen, China

Publication Topics

Image Reconstruction,
Spiral Computed Tomography,
X-ray Source,
Filtered Back Projection,
Hardware Architecture,
Hilbert Transform,
Project Data,
Reconstruction Algorithm,
Source Position,
Spiral Scan,
Transaction Level,
Unit Vector

Publications

3

Citations

0

Publications by Year

20102010

Co-Authors:

Yan Zhang

Author's Published Works

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Showing 1-5 of 5 results

Conferences (4)

Journals (1)

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Xuechao Wang(5)
Marzieh Karami(3)
Rangarajan M. Tallam(3)
Rangarajan Tallam(2)
Garron Morris(1)
LV Drives, Rockwell Automation, Milwaukee, WI, USA(1)
Milwaukee Tool(1)
LV Drives, Rockwell Automation, Mequon, WI(1)
Rockwell Automation(1)
Low Voltage Drives, Rockwell Automation, Mequon, WI, USA(1)
2018 IEEE Applied Power Electronics Conference and Exposition (APEC)(1)
2018 IEEE Energy Conversion Congress and Exposition (ECCE)(1)
2019 Annual Reliability and Maintainability Symposium (RAMS)(1)
2019 IEEE Applied Power Electronics Conference and Exposition (APEC)(1)
IEEE Transactions on Industry Applications(1)
IEEE(5)
Anaheim, CA, USA(1)
Orlando, FL, USA(1)
Portland, OR, USA(1)
San Antonio, TX, USA(1)
Equivalent Series Resistance(4)
Bridge Rectifier(3)
DC Bias(3)
DC Bias Voltage(3)
DC Voltage(3)

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Reliability Test Setup for Liquid Aluminum Electrolytic Capacitor Testing

Xuechao Wang;Rangarajan Tallam;Anshul Shrivastava;Garron Morris

2019 Annual Reliability and Maintainability Symposium (RAMS)

Year: 2019 | Conference Paper |

Cited by: Papers (5)

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Bus capacitors play a critical role in the operation of Variable Frequency Drives (VFDs). Failure of bus capacitors can cause a failure of the drive leading to unplanned downtime and substantial revenue loss for customers. In VFDs, liquid aluminum electrolytic capacitors are used as bus capacitors for smoothing of voltage and when line can't provide large bursts of energy (drive start-up) and duri...Show More

Reliability Test Setup for Liquid Aluminum Electrolytic Capacitor Testing

Xuechao Wang;Rangarajan Tallam;Anshul Shrivastava;Garron Morris

2019 Annual Reliability and Maintainability Symposium (RAMS)

Year: 2019 | Conference Paper |

A Novel Configuration of DC Link EMI Filter Capacitors in Variable Frequency Drives

Xuechao Wang;Lakshmi Ravi;Michael P. Albert;Rangarajan M. Tallam

2019 IEEE Applied Power Electronics Conference and Exposition (APEC)

Year: 2019 | Conference Paper |

Cited by: Papers (1)

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Direct Current (DC) link electro-magnetic interference (EMI) suppression filter capacitors are normally connected between the DC bus positive and negative nodes to the Earth node in variable frequency drives (VFDs) to minimize voltage overshoots from power device switching action as well as to suppress the electromagnetic interference (EMI) generated by the drive. With long motor leads, the switch...Show More

A Novel Configuration of DC Link EMI Filter Capacitors in Variable Frequency Drives

Xuechao Wang;Lakshmi Ravi;Michael P. Albert;Rangarajan M. Tallam

2019 IEEE Applied Power Electronics Conference and Exposition (APEC)

Year: 2019 | Conference Paper |

Test Fixtures to Apply Variable DC Bias and AC Ripple Current for Reliability Testing of Electrolytic Capacitors

Xuechao Wang;Marzieh Karami;Rangarajan M. Tallam

IEEE Transactions on Industry Applications

Year: 2019 | Volume: 55, Issue: 4 | Journal Article |

Cited by: Papers (14)

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Electrolytic capacitors are widely used in the dc link of variable frequency drives (VFDs). Their reliability has a significant impact on VFD performance and lifetime. Typically, the lifetime of electrolytic capacitors is specified in vendors' datasheets at the rated continuous dc voltage and at the rated ripple current at one fixed frequency, under rated temperature, and humidity conditions. In o...Show More

Test Fixtures to Apply Variable DC Bias and AC Ripple Current for Reliability Testing of Electrolytic Capacitors

Xuechao Wang;Marzieh Karami;Rangarajan M. Tallam

IEEE Transactions on Industry Applications

Year: 2019 | Volume: 55, Issue: 4 | Journal Article |

Test Fixture to Measure the Saturation Characteristics of Coupled Multi-Winding Inductors

Marzieh Karami;Xuechao Wang;Rangarajan Tallam

2018 IEEE Energy Conversion Congress and Exposition (ECCE)

Year: 2018 | Conference Paper |

Cited by: Papers (2)

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In this paper, a test fixture is developed to measure the saturation characteristics of coupled multi-winding inductors. Unlike prior art methods, the fixture can be used to measure CM (DM) saturation characteristics, with both CM and DM currents present. Experimental results are provided for a DC link inductor and a three-phase inductor, with integrated CM and DM inductance. Results from these te...Show More

Test Fixture to Measure the Saturation Characteristics of Coupled Multi-Winding Inductors

Marzieh Karami;Xuechao Wang;Rangarajan Tallam

2018 IEEE Energy Conversion Congress and Exposition (ECCE)

Year: 2018 | Conference Paper |

Test fixture to apply DC bias and AC ripple current for reliability testing of electrolytic capacitors

Xuechao Wang;Marzieh Karami;Rangarajan M. Tallam

2018 IEEE Applied Power Electronics Conference and Exposition (APEC)

Year: 2018 | Conference Paper |

Cited by: Papers (1)

HTML

Electrolytic capacitors are widely used in the DC link of variable frequency drives (VFDs). Their reliability has a significant impact on VFD performance and life time. Typically, the life time of electrolytic capacitors is specified in vendors' datasheets at the rated continuous DC voltage and at the rated ripple current at one fixed frequency, under rated temperature and humidity conditions. In ...Show More

Test fixture to apply DC bias and AC ripple current for reliability testing of electrolytic capacitors

Xuechao Wang;Marzieh Karami;Rangarajan M. Tallam

2018 IEEE Applied Power Electronics Conference and Exposition (APEC)

Year: 2018 | Conference Paper |

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