Scheduled Maintenance on Monday 1/13/2025

Single article sales and account management will be unavailable from 5:00 AM - 7:00 PM ET (09:00 - 23:00 UTC). We apologize for the inconvenience.

IEEE.org
IEEE Xplore
IEEE SA
IEEE Spectrum
More Sites

- Donate
- Personal Sign In

Institutional Sign In

ADVANCED SEARCH

Search History

Showing 1 of 1 result

Conferences (1)

Sort

Filter Results

Show

All Results

Open Access Only

Range
Single Year
Mingyi Jiang(1)
Peizhang Yu(1)
Enguo Wang(1)
Yinhan Gao(1)
Yang Liu(1)
College Of Mechanical And Electric Engineering Of CUST, Changchun University of Science and Technology, Changchun, China(1)
College of Instrumentation & Electrical Engineering, Jilin University, Changchun, China(1)
Baicheng ordnance test center of China, Baicheng, China(1)
2012 International Conference on Optoelectronics and Microelectronics(1)
IEEE(1)
Changchun, China(1)
Arbitrary Point(1)
Circle Points(1)
Cone Angle(1)
Cone Section(1)
Conical Surface(1)

Select All on Page

Sort By

Results

New algorithm of measuring the cone section with the coordinate machine measurement

Enguo Wang;Yinhan Gao;Chengzhi Su;Peizhang Yu;Mingyi Jiang;Yang Liu

2012 International Conference on Optoelectronics and Microelectronics

Year: 2012 | Conference Paper |

Cited by: Papers (1)

HTML

A new method for measuring a given cross-section diameter of the cone by the coordinate measuring machine is presented in this paper. Firstly, the surface of the cone is sampled by the coordinate measuring machine, then the cone equation parameters are obtained based on these data. Secondly, sample the circle of the conical cross section in the specified location. Thirdly the linear interpolation ...Show More

New algorithm of measuring the cone section with the coordinate machine measurement

Enguo Wang;Yinhan Gao;Chengzhi Su;Peizhang Yu;Mingyi Jiang;Yang Liu

2012 International Conference on Optoelectronics and Microelectronics

Year: 2012 | Conference Paper |

IEEE Personal Account

Change username/password

Purchase Details

Payment Options
View Purchased Documents

Profile Information

Communications Preferences
Profession and Education
Technical interests

Need Help?

US & Canada: +1 800 678 4333
Worldwide: +1 732 981 0060
Contact & Support

Follow

A public charity, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.

IEEE Account

Change Username/Password
Update Address

Purchase Details

Payment Options
Order History
View Purchased Documents

Profile Information

Communications Preferences
Profession and Education
Technical Interests

Need Help?

US & Canada: +1 800 678 4333
Worldwide: +1 732 981 0060
Contact & Support

About IEEE Xplore
Contact Us
Help
Accessibility
Terms of Use
Nondiscrimination Policy
Sitemap
Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.