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Kalyan Sunkavalli - IEEE Xplore Author Profile
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Kalyan Sunkavalli

Publications
44
Citations
2,417
Publications by Year
20072024
Co-Authors:
Show All Co-Authors (107)
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Kalyan Sunkavalli

Affiliation

Adobe Research

Publication Topics

Biography

Kalyan Sunkavalli received the graduation degree from the Indian Institute of Technology, Delhi in 2003, the master's degree from Columbia University in 2006, and the PhD degree from Harvard University in 2012. He is a principal scientist with Adobe Research. His research interests lie at the intersection of computer vision and graphics; in particular, his work focuses on understanding visual appearance in images and videos.(Based on document published on 17 May 2023).
Publications
44
Citations
2,417
Publications by Year
20072024
Co-Authors:
Show All Co-Authors (107)
Author's Published Works

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A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio \Sigma\Delta ADC

Manuel J. Barragan;Rshdee Alhakim;Haralampos-G. Stratigopoulos;Matthieu Dubois;Salvador Mir;Hervé Le Gall;Neha Bhargava;Ankur Bal

IEEE Transactions on Circuits and Systems I: Regular Papers
Year: 2016 | Volume: 63, Issue: 11 | Journal Article |
Cited by: Papers (18)
This paper proposes a fully-digital BIST architecture for the dynamic test of ΣΔ ADCs. The proposed BIST relies on generating a ternary stream that encodes a high-linearity analog sinusoidal and injecting it directly at the input of the ΣΔ modulator. Compared to the well-known bitstream, the use of three logic levels in the ternary stream reduces the quantization noise and, thereby, results in a t...Show More

A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio $\Sigma\Delta$ ADC

Manuel J. Barragan;Rshdee Alhakim;Haralampos-G. Stratigopoulos;Matthieu Dubois;Salvador Mir;Hervé Le Gall;Neha Bhargava;Ankur Bal

Year: 2016 | Volume: 63, Issue: 11 | Journal Article |

Evaluation of digital ternary stimuli for dynamic test of ΣΔ ADCs

Matthieu Dubois;Haralampos-G. Stratigopoulos;Salvador Mir;Manuel J. Barragan

2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC)
Year: 2014 | Conference Paper |
Cited by: Papers (4)
Validation of an embedded test technique in terms of its expected yield loss and test escape metrics is a key step before it can be deployed in high-volume manufacturing. However, performing this validation at the design stage usually demands extensive computational resources, which may render electrical simulations infeasible. In this paper, we propose a digital test technique for dynamic test of...Show More

Evaluation of digital ternary stimuli for dynamic test of ΣΔ ADCs

Matthieu Dubois;Haralampos-G. Stratigopoulos;Salvador Mir;Manuel J. Barragan

Year: 2014 | Conference Paper |

A frequency measurement BIST implementation targeting gigahertz application

Matthieu Dubois;Emeric De Foucauld;Christopher Mounet;Sérigne Dia;Cédric Mayor

2012 IEEE International Test Conference
Year: 2012 | Conference Paper |
In this paper we present a Built-In Self-Test (BIST) technique to measure the natural resonance frequency of oscillators which are design to set a much higher than the working speed of most of the current Automated Test Equipment (ATE). Based on an asynchronous counter, the BIST answers by a digital output code proportional to the frequency of the oscillator under test. The efficiency of the sugge...Show More

A frequency measurement BIST implementation targeting gigahertz application

Matthieu Dubois;Emeric De Foucauld;Christopher Mounet;Sérigne Dia;Cédric Mayor

Year: 2012 | Conference Paper |

Ternary Stimulus for Fully Digital Dynamic Testing of SC S? ADCs

Matthieu Dubois;Haralampos G. Stratigopoulos;Salvador Mir

2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop
Year: 2012 | Conference Paper |
Cited by: Papers (8) | Patents (2)
In this paper, a ternary stimulus is proposed for testing ΣΔ Analog-to-Digital Converters (ADCs). The ternary stimulus is composed of three logic levels {-1,0,1} and is obtained by adding a binary stream with a delayed version of itself. Only four switches are added to the input stage of the modulator of the ΣΔ ADC for facilitating the injection of the ternary stimulus. Compared to a binary stimul...Show More

Ternary Stimulus for Fully Digital Dynamic Testing of SC S? ADCs

Matthieu Dubois;Haralampos G. Stratigopoulos;Salvador Mir

Year: 2012 | Conference Paper |

Hierarchical parametric test metrics estimation: A ΣΔ converter BIST case study

Matthieu Dubois;Haralampos-G. Stratigopoulos;Salvador Mir

2009 IEEE International Conference on Computer Design
Year: 2009 | Conference Paper |
Cited by: Papers (4)
In this paper we propose a method for evaluating test measurements for complex circuits that are difficult to simulate. The evaluation aims at estimating test metrics, such as parametric test escape and yield loss, with parts per million (ppm) accuracy. To achieve this, the method combines behavioral modeling, density estimation, and regression. The method is demonstrated for a previously proposed...Show More

Hierarchical parametric test metrics estimation: A ΣΔ converter BIST case study

Matthieu Dubois;Haralampos-G. Stratigopoulos;Salvador Mir

Year: 2009 | Conference Paper |

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