Heng Zhang - IEEE Xplore Author Profile

Scheduled Maintenance on Monday 1/13/2025

Single article sales and account management will be unavailable from 5:00 AM - 7:00 PM ET (09:00 - 23:00 UTC). We apologize for the inconvenience.

IEEE.org
IEEE Xplore
IEEE SA
IEEE Spectrum
More Sites

- Donate
- Personal Sign In

Access provided by:

MIT Libraries

Access provided by:

MIT Libraries

ADVANCED SEARCH

Author details

Heng Zhang

Publications

8

Citations

71

Publications by Year

20232024

Co-Authors:

Mustafa AyazogluYichuan BaiHaoran BaiBahri Batuhan BilecenQixuan Cai

Show All Co-Authors (218)

Heng Zhang

Affiliation

School of Electronic Science and Engineering

Nanjing University

Nanjing, China

Publication Topics

Analog-to-digital Converter,
Static Random Access Memory,
Convolutional Layers,
Convolutional Neural Network,
Quantization Error,
Neural Network,
Partial Sums,
Adam Optimizer,
Analog Computing,
Analog Domain,
Bit-width,
Charged Domain

Biography

Heng Zhang received the B.S. and M.S. degrees in microelectromechanical systems from Northwestern Polytechnical University, Xi'an, China, in 2018 and 2021, respectively. He is currently working toward the Ph.D. degree with the School of Electronic Science and Engineering, Nanjing University, Nanjing, China.(Based on document published on 20 December 2023).

Publications

8

Citations

71

Publications by Year

20232024

Co-Authors:

Mustafa Ayazoglu
Yichuan Bai
Haoran Bai
Bahri Batuhan Bilecen
Qixuan Cai

Show All Co-Authors (218)

Author's Published Works

Search History

Showing 1-4 of 4 results

Conferences (4)

Sort

Filter Results

Show

Subscribed Content

Open Access Only

Range
Single Year
Xuanwu Yin(4)
Yuqing Liu(4)
Hongyuan Yu(4)
Kunlong Zuo(4)
Heng Zhang(3)
Nanyang Technological University(2)
SenseTime Research and Tetras.AI(2)
Shanghai AI Laboratory(2)
SenseBrain(2)
ETH Zürich, Switzerland(1)
2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)(2)
2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)(2)
IEEE(4)
Seattle, WA, USA(2)
Vancouver, BC, Canada(2)
Peak Signal-to-noise Ratio(4)
Adam Optimizer(3)
Convolutional Layers(3)
L1 Loss(3)
Learning Rate(3)

Select All on Page

Sort By

Results

Real-Time 4K Super-Resolution of Compressed AVIF Images. AIS 2024 Challenge Survey

Marcos V. Conde;Zhijun Lei;Wen Li;Ioannis Katsavounidis;Radu Timofte;Min Yan;Xin Liu;Qian Wang;Xiaoqian Ye;Zhan Du;Tiansen Zhang;Zhiyuan Li;Hao Wei;Chenyang Ge;Jiangtao Lv;Long Sun;Jinshan Pan;Jiangxin Dong;Jinhui Tang;Menghan Zhou;Yiqiang Yan;Kihwan Yoon;Ganzorig Gankhuyag;Jae-Hyeon Lee;Ui-Jin Choi;Hyeon-Cheol Moon;Tae-Hyun Jeong;Yoonmo Yang;Jae-Gon Kim;Jinwoo Jeong;Sunjei Kim;Xintao Qiu;Yuanbo Zhou;Kongxian Wu;Xinwei Dai;Hui Tang;Wei Deng;Qingquan Gao;Tong Tong;Long Peng;Jiaming Guo;Xin Di;Bohao Liao;Zhibo Du;Peize Xia;Renjing Pei;Yang Wang;Yang Cao;Zhengjun Zha;Bingnan Han;Hongyuan Yu;Zhuoyuan Wu;Cheng Wan;Yuqing Liu;Haodong Yu;Jizhe Li;Zhijuan Huang;Yuan Huang;Yajun Zou;Xianyu Guan;Qi Jia;Heng Zhang;Xuanwu Yin;Kunlong Zuo;Dongyang Zhang;Tianle Liu;Huaian Chen;Yi Jin

2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2024 | Conference Paper |

Cited by: Papers (4)

HTML

This paper introduces a novel benchmark for efficient image upscaling as part of the AIS 2024 Real-Time Image Super-Resolution (RTSR) Challenge, which aims to up scale compressed images from 540p to native 4K resolution (4x factor) in real-time on commercial GPUs. For this, we use a diverse test set containing diverse 4K images ranging from digital art to gaming and photography. The images are com...Show More

Real-Time 4K Super-Resolution of Compressed AVIF Images. AIS 2024 Challenge Survey

Marcos V. Conde;Zhijun Lei;Wen Li;Ioannis Katsavounidis;Radu Timofte;Min Yan;Xin Liu;Qian Wang;Xiaoqian Ye;Zhan Du;Tiansen Zhang;Zhiyuan Li;Hao Wei;Chenyang Ge;Jiangtao Lv;Long Sun;Jinshan Pan;Jiangxin Dong;Jinhui Tang;Menghan Zhou;Yiqiang Yan;Kihwan Yoon;Ganzorig Gankhuyag;Jae-Hyeon Lee;Ui-Jin Choi;Hyeon-Cheol Moon;Tae-Hyun Jeong;Yoonmo Yang;Jae-Gon Kim;Jinwoo Jeong;Sunjei Kim;Xintao Qiu;Yuanbo Zhou;Kongxian Wu;Xinwei Dai;Hui Tang;Wei Deng;Qingquan Gao;Tong Tong;Long Peng;Jiaming Guo;Xin Di;Bohao Liao;Zhibo Du;Peize Xia;Renjing Pei;Yang Wang;Yang Cao;Zhengjun Zha;Bingnan Han;Hongyuan Yu;Zhuoyuan Wu;Cheng Wan;Yuqing Liu;Haodong Yu;Jizhe Li;Zhijuan Huang;Yuan Huang;Yajun Zou;Xianyu Guan;Qi Jia;Heng Zhang;Xuanwu Yin;Kunlong Zuo;Dongyang Zhang;Tianle Liu;Huaian Chen;Yi Jin

2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2024 | Conference Paper |

The Ninth NTIRE 2024 Efficient Super-Resolution Challenge Report

Bin Ren;Yawei Li;Nancy Mehta;Radu Timofte;Hongyuan Yu;Cheng Wan;Yuxin Hong;Bingnan Han;Zhuoyuan Wu;Yajun Zou;Yuqing Liu;Jizhe Li;Keji He;Chao Fan;Heng Zhang;Xiaolin Zhang;Xuanwu Yin;Kunlong Zuo;Bohao Liao;Peizhe Xia;Long Peng;Zhibo Du;Xin Di;Wangkai Li;Yang Wang;Wei Zhai;Renjing Pei;Jiaming Guo;Songcen Xu;Yang Cao;Zhengjun Zha;Yan Wang;Yi Liu;Qing Wang;Gang Zhang;Liou Zhang;Shijie Zhao;Long Sun;Jinshan Pan;Jiangxin Dong;Jinhui Tang;Xin Liu;Min Yan;Qian Wang;Menghan Zhou;Yiqiang Yan;Yixuan Liu;Wensong Chan;Dehua Tang;Dong Zhou;Li Wang;Lu Tian;Barsoum Emad;Bohan Jia;Junbo Qiao;Yunshuai Zhou;Yun Zhang;Wei Li;Shaohui Lin;Shenglong Zhou;Binbin Chen;Jincheng Liao;Suiyi Zhao;Zhao Zhang;Bo Wang;Yan Luo;Yanyan Wei;Feng Li;Mingshen Wang;Yawei Li;Jinhan Guan;Dehua Hu;Jiawei Yu;Qisheng Xu;Tao Sun;Long Lan;Kele Xu;Xin Lin;Jingtong Yue;Lehan Yang;Shiyi Du;Lu Qi;Chao Ren;Zeyu Han;Yuhan Wang;Chaolin Chen;Haobo Li;Mingjun Zheng;Zhongbao Yang;Lianhong Song;Xingzhuo Yan;Minghan Fu;Jingyi Zhang;Baiang Li;Qi Zhu;Xiaogang Xu;Dan Guo;Chunle Guo;Jiadi Chen;Huanhuan Long;Chunjiang Duanmu;Xiaoyan Lei;Jie Liu;Weilin Jia;Weifeng Cao;Wenlong Zhang;Yanyu Mao;Ruilong Guo;Nihao Zhang;Qian Wang;Manoj Pandey;Maksym Chernozhukov;Giang Le;Shuli Cheng;Hongyuan Wang;Ziyan Wei;Qingting Tang;Liejun Wang;Yongming Li;Yanhui Guo;Hao Xu;Akram Khatami-Rizi;Ahmad Mahmoudi-Aznaveh;Chih-Chung Hsu;Chia-Ming Lee;Yi-Shiuan Chou;Amogh Joshi;Nikhil Akalwadi;Sampada Malagi;Palani Yashaswini;Chaitra Desai;Ramesh Ashok Tabib;Ujwala Patil;Uma Mudenagudi

2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2024 | Conference Paper |

Cited by: Papers (23)

HTML

This paper provides a comprehensive review of the NTIRE 2024 challenge, focusing on efficient single-image super-resolution (ESR) solutions and their outcomes. The task of this challenge is to super-resolve an input image with a magnification factor of ×4 based on pairs of low and corresponding high-resolution images. The primary objective is to develop networks that optimize various aspects such ...Show More

The Ninth NTIRE 2024 Efficient Super-Resolution Challenge Report

Bin Ren;Yawei Li;Nancy Mehta;Radu Timofte;Hongyuan Yu;Cheng Wan;Yuxin Hong;Bingnan Han;Zhuoyuan Wu;Yajun Zou;Yuqing Liu;Jizhe Li;Keji He;Chao Fan;Heng Zhang;Xiaolin Zhang;Xuanwu Yin;Kunlong Zuo;Bohao Liao;Peizhe Xia;Long Peng;Zhibo Du;Xin Di;Wangkai Li;Yang Wang;Wei Zhai;Renjing Pei;Jiaming Guo;Songcen Xu;Yang Cao;Zhengjun Zha;Yan Wang;Yi Liu;Qing Wang;Gang Zhang;Liou Zhang;Shijie Zhao;Long Sun;Jinshan Pan;Jiangxin Dong;Jinhui Tang;Xin Liu;Min Yan;Qian Wang;Menghan Zhou;Yiqiang Yan;Yixuan Liu;Wensong Chan;Dehua Tang;Dong Zhou;Li Wang;Lu Tian;Barsoum Emad;Bohan Jia;Junbo Qiao;Yunshuai Zhou;Yun Zhang;Wei Li;Shaohui Lin;Shenglong Zhou;Binbin Chen;Jincheng Liao;Suiyi Zhao;Zhao Zhang;Bo Wang;Yan Luo;Yanyan Wei;Feng Li;Mingshen Wang;Yawei Li;Jinhan Guan;Dehua Hu;Jiawei Yu;Qisheng Xu;Tao Sun;Long Lan;Kele Xu;Xin Lin;Jingtong Yue;Lehan Yang;Shiyi Du;Lu Qi;Chao Ren;Zeyu Han;Yuhan Wang;Chaolin Chen;Haobo Li;Mingjun Zheng;Zhongbao Yang;Lianhong Song;Xingzhuo Yan;Minghan Fu;Jingyi Zhang;Baiang Li;Qi Zhu;Xiaogang Xu;Dan Guo;Chunle Guo;Jiadi Chen;Huanhuan Long;Chunjiang Duanmu;Xiaoyan Lei;Jie Liu;Weilin Jia;Weifeng Cao;Wenlong Zhang;Yanyu Mao;Ruilong Guo;Nihao Zhang;Qian Wang;Manoj Pandey;Maksym Chernozhukov;Giang Le;Shuli Cheng;Hongyuan Wang;Ziyan Wei;Qingting Tang;Liejun Wang;Yongming Li;Yanhui Guo;Hao Xu;Akram Khatami-Rizi;Ahmad Mahmoudi-Aznaveh;Chih-Chung Hsu;Chia-Ming Lee;Yi-Shiuan Chou;Amogh Joshi;Nikhil Akalwadi;Sampada Malagi;Palani Yashaswini;Chaitra Desai;Ramesh Ashok Tabib;Ujwala Patil;Uma Mudenagudi

2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2024 | Conference Paper |

MIPI 2023 Challenge on RGBW Fusion: Methods and Results

Qianhui Sun;Qingyu Yang;Chongyi Li;Shangchen Zhou;Ruicheng Feng;Yuekun Dai;Wenxiu Sun;Qingpeng Zhu;Chen Change Loy;Jinwei Gu;Hongyuan Yu;Yuqing Liu;Weichen Yu;Lin Ge;Xiaolin Zhang;Qi Jia;Heng Zhang;Xuanwu Yin;Kunlong Zuo;Qi Wu;Wenjie Lin;Ting Jiang;Chengzhi Jiang;Mingyan Han;Xinpeng Li;Jinting Luo;Lei Yu;Haoqiang Fan;Shuaicheng Liu;Kunyu Wang;Chengzhi Cao;Yuanshen Guan;Jiyuan Xia;Ruikang Xu;Mingde Yao;Zhiwei Xiong

2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2023 | Conference Paper |

Cited by: Papers (3)

HTML

Developing and integrating advanced image sensors with novel algorithms in camera systems are prevalent with the increasing demand for computational photography and imaging on mobile platforms. However, the lack of high-quality data for research and the rare opportunity for an in-depth exchange of views from industry and academia constrain the development of mobile intelligent photography and imag...Show More

MIPI 2023 Challenge on RGBW Fusion: Methods and Results

Qianhui Sun;Qingyu Yang;Chongyi Li;Shangchen Zhou;Ruicheng Feng;Yuekun Dai;Wenxiu Sun;Qingpeng Zhu;Chen Change Loy;Jinwei Gu;Hongyuan Yu;Yuqing Liu;Weichen Yu;Lin Ge;Xiaolin Zhang;Qi Jia;Heng Zhang;Xuanwu Yin;Kunlong Zuo;Qi Wu;Wenjie Lin;Ting Jiang;Chengzhi Jiang;Mingyan Han;Xinpeng Li;Jinting Luo;Lei Yu;Haoqiang Fan;Shuaicheng Liu;Kunyu Wang;Chengzhi Cao;Yuanshen Guan;Jiyuan Xia;Ruikang Xu;Mingde Yao;Zhiwei Xiong

2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2023 | Conference Paper |

MIPI 2023 Challenge on RGBW Remosaic: Methods and Results

Qianhui Sun;Qingyu Yang;Chongyi Li;Shangchen Zhou;Ruicheng Feng;Yuekun Dai;Wenxiu Sun;Qingpeng Zhu;Chen Change Loy;Jinwei Gu;Yuqing Liu;Hongyuan Yu;Weichen Yu;Zhen Dong;Binnan Han;Qi Jia;Xuanwu Yin;Kunlong Zuo;Yaqi Wu;Zhihao Fan;Fanqing Meng;Xun Wu;Jiawei Zhang;Feng Zhang;Mingyan Han;Jinting Luo;Qi Wu;Ting Jiang;Chengzhi Jiang;Wenjie Lin;Xinpeng Li;Lei Yu;Haoqiang Fan;Shuaicheng Liu

2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2023 | Conference Paper |

Cited by: Papers (4)

HTML

Developing and integrating advanced image sensors with novel algorithms in camera systems are prevalent with the increasing demand for computational photography and imaging on mobile platforms. However, the lack of high-quality data for research and the rare opportunity for an in-depth exchange of views from industry and academia constrain the development of mobile intelligent photography and imag...Show More

MIPI 2023 Challenge on RGBW Remosaic: Methods and Results

Qianhui Sun;Qingyu Yang;Chongyi Li;Shangchen Zhou;Ruicheng Feng;Yuekun Dai;Wenxiu Sun;Qingpeng Zhu;Chen Change Loy;Jinwei Gu;Yuqing Liu;Hongyuan Yu;Weichen Yu;Zhen Dong;Binnan Han;Qi Jia;Xuanwu Yin;Kunlong Zuo;Yaqi Wu;Zhihao Fan;Fanqing Meng;Xun Wu;Jiawei Zhang;Feng Zhang;Mingyan Han;Jinting Luo;Qi Wu;Ting Jiang;Chengzhi Jiang;Wenjie Lin;Xinpeng Li;Lei Yu;Haoqiang Fan;Shuaicheng Liu

2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2023 | Conference Paper |

IEEE Personal Account

Change username/password

Purchase Details

Payment Options
View Purchased Documents

Profile Information

Communications Preferences
Profession and Education
Technical interests

Need Help?

US & Canada: +1 800 678 4333
Worldwide: +1 732 981 0060
Contact & Support

Follow

About IEEE Xplore | Contact Us | Help | Accessibility | Terms of Use | Nondiscrimination Policy | IEEE Ethics Reporting | Sitemap | IEEE Privacy Policy

A public charity, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.

© Copyright 2025 IEEE - All rights reserved, including rights for text and data mining and training of artificial intelligence and similar technologies.

IEEE Account

Change Username/Password
Update Address

Purchase Details

Payment Options
Order History
View Purchased Documents

Profile Information

Communications Preferences
Profession and Education
Technical Interests

Need Help?

US & Canada: +1 800 678 4333
Worldwide: +1 732 981 0060
Contact & Support

About IEEE Xplore
Contact Us
Help
Accessibility
Terms of Use
Nondiscrimination Policy
Sitemap
Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.

Test Whats new message.