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Abhinav Gaur

Affiliation

Rochester Institute of Technology

Rochester

NY, USA

imec, Leuven, Belgium

Publication Topics

Defect Density,
High-resolution X-ray Diffraction,
Molecular Beam Epitaxy,
Negative Differential Resistance,
Si Substrate,
Tunnel Diode,
Active Layer,
Atomic Force Microscopy,
Band Edge,
Bias Point,
Bias Range,
Bipolar Transistor

Biography

Abhinav Gaur received the bachelor’s degree in electronics engineering from the Jaypee Institute of Information Technology, Noida, India, in 2012, and the M.S. degree in microelectronic engineering from the Rochester Institute of Technology, Rochester, NY, USA. He is currently pursuing the Ph.D. degree with imec, Leuven, Belgium.,He is involved in 2-D materials like graphene and metal dichalcogenides.(Based on document published on 10 July 2015).

Publications

Citations

Publications by Year

20142015

Co-Authors:

Kunal Bhatnagar
Rocio Contreras-Guerrero
Ravi Droopad
Matthew Filmer
Chris Hobbs

Show All Co-Authors (16)

Author's Published Works

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Abhinav Gaur

Abhinav Gaur

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Machine Component Clustering with Mixing Technique of DSM, Jaccard Distance Coefficient and k-Means Algorithm

Machine Component Clustering with Mixing Technique of DSM, Jaccard Distance Coefficient and k-Means Algorithm

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Abhinav Gaur

Abhinav Gaur

Affiliation

Publication Topics

Biography

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Machine Component Clustering with Mixing Technique of DSM, Jaccard Distance Coefficient and k-Means Algorithm

Machine Component Clustering with Mixing Technique of DSM, Jaccard Distance Coefficient and k-Means Algorithm