Loading [MathJax]/extensions/MathMenu.js
Hongguang Zhang - IEEE Xplore Author Profile
Access provided by:

MIT Libraries

Sign Out
Access provided by:

MIT Libraries

Sign Out
ADVANCED SEARCH

Author details

< Back

Hongguang Zhang

Also published under: HongGuang Zhang

Publications
21
Citations
68
Publications by Year
20202024
Co-Authors:
Show All Co-Authors (74)
Headshot silhouette indicating that no photo is available for this author

Hongguang Zhang

Also published under: HongGuang Zhang

Affiliation

National Information Optoelectronics Innovation Center
China Information and Communication Technologies Group Corporation
Wuhan, China

Publication Topics

Biography

Hongguang Zhang received the Ph.D. degree in physical electronics from the Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China, in 2010. His research interests include optical chips and devices used in optical communication, optical device packaging integration, and high-speed optical communications.(Based on document published on 13 March 2023).
Publications
21
Citations
68
Publications by Year
20202024
Co-Authors:
Show All Co-Authors (74)
Author's Published Works

Showing 1-6 of 6 results

  • Sort

Filter Results

Show

Sort By

Results

An Experimental Device to Investigate Columnar Recombination Models

K. Irazoqui;P. Filliatre;G. de Izarra;J. Wagemans

2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
Year: 2022 | Conference Paper |
In this paper, we discuss electron-ion recombination processes in gaseous argon with the aim to improve fission chambers models. Boag-Chabod’s model of columnar recombination is presented and its parameters detailed. The dimensioning of an experimental device to investigate this model is proposed. The specifications and the simulation of the device are presented. We conclude on the expected result...Show More

An Experimental Device to Investigate Columnar Recombination Models

K. Irazoqui;P. Filliatre;G. de Izarra;J. Wagemans

Year: 2022 | Conference Paper |

Comparison Between Silicon Carbide and Diamond for Thermal Neutron Detection at Room Temperature

O. Obraztsova;L. Ottaviani;B. Geslot;G. de Izarra;O. Palais;A. Lyoussi;W. Vervisch

IEEE Transactions on Nuclear Science
Year: 2020 | Volume: 67, Issue: 5 | Journal Article |
Cited by: Papers (14)
Neutron radiation detector for nuclear reactor applications plays an important role in getting information about the actual neutron flux. Such a detector must be able to operate at high neutron flux levels (>109 cm-2 s-1) and discriminate the neutron and gamma responses in the nuclear reactor's mixed neutron-gamma environment. Silicon carbide and diamond are the most attractive semiconductor mater...Show More

Comparison Between Silicon Carbide and Diamond for Thermal Neutron Detection at Room Temperature

O. Obraztsova;L. Ottaviani;B. Geslot;G. de Izarra;O. Palais;A. Lyoussi;W. Vervisch

Year: 2020 | Volume: 67, Issue: 5 | Journal Article |

Comparison between Silicon-arbide and Diamond for Thermal neutron detection at Room Temperature

O. Obraztsova;L. Ottaviani;B. Geslot;G. de Izarra;O. Palais;A. Lyoussi;W. Vervisch

2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
Year: 2017 | Conference Paper |
Neutron radiation detector for nuclear reactor applications plays an important role in getting information about the actual neutron yield and reactor environment. Such detector must be able to operate at high neutron flux levels (>109 n/(cm2s)) and discriminate the neutron and gammaresponses in the nuclear reactor's mixed neutron-gamma environment. Moreover such a detector must have fast and stabl...Show More

Comparison between Silicon-arbide and Diamond for Thermal neutron detection at Room Temperature

O. Obraztsova;L. Ottaviani;B. Geslot;G. de Izarra;O. Palais;A. Lyoussi;W. Vervisch

Year: 2017 | Conference Paper |

Kinetic Parameter Measurements in the MINERVE Reactor

Grégory Perret;Benoit Geslot;Adrien Gruel;Patrick Blaise;Jacques Di-Salvo;Grégoire De Izarra;Christian Jammes;Mathieu Hursin;Andréas Pautz

IEEE Transactions on Nuclear Science
Year: 2017 | Volume: 64, Issue: 1 | Journal Article |
Cited by: Papers (10)
In the framework of an international collaboration, teams of the PSI and CEA research institutes measure the critical decay constant (α0 = β/A), delayed neutron fraction (β) and generation time (A) of the Minerve reactor using the Feynman-α, Power Spectral Density and Rossi-α neutron noise measurement techniques. These measurements contribute to the experimental database of kinetic parameters used...Show More

Kinetic Parameter Measurements in the MINERVE Reactor

Grégory Perret;Benoit Geslot;Adrien Gruel;Patrick Blaise;Jacques Di-Salvo;Grégoire De Izarra;Christian Jammes;Mathieu Hursin;Andréas Pautz

Year: 2017 | Volume: 64, Issue: 1 | Journal Article |

Pile noise experiment in MINERVE reactor to estimate kinetic parameters using various data processing methods

Benoit Geslot;Adrien Gruel;Alexandra Pepino;Jacques Di Salvo;Grégoire de Izarra;Christian Jammes;Christophe Destouches;Patrick Blaise

2015 4th International Conference on Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA)
Year: 2015 | Conference Paper |
Cited by: Papers (5)
MINERVE is a two-zone pool type zero power reactor operated by cea (Cadarache, France). Kinetic parameters of the core (prompt neutron decay constant, delayed neutron fraction, generation time) have been recently measured using various pile noise experimental techniques, namely Feynman-α, Rossi-α and Cohn-α. Results are discussed and compared to each other's. The measurement campaign has been cond...Show More

Pile noise experiment in MINERVE reactor to estimate kinetic parameters using various data processing methods

Benoit Geslot;Adrien Gruel;Alexandra Pepino;Jacques Di Salvo;Grégoire de Izarra;Christian Jammes;Christophe Destouches;Patrick Blaise

Year: 2015 | Conference Paper |

IEEE Account

Purchase Details

Profile Information

Need Help?

A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.
© Copyright 2025 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.