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Can Ding - IEEE Xplore Author Profile

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Author details

Can Ding

Publications

38

Citations

62

Publications by Year

20142025

Co-Authors:

Xing ChenXiwen ChenJiangbo ChenTianfan ChenCheng Chen

Show All Co-Authors (68)

Can Ding

Affiliation

College of Electrical Engineering and New Energy

China Three Gorges University

Yichang, China

Publication Topics

Fault Identification,
Simulation Results,
Transmission Line,
Types Of Defects,
Attention Mechanism,
Current Transformer,
Distribution Network,
Fault Diagnosis,
Fault Features,
Fault Zone,
Finite Element,
Artificial Neural Network

Biography

Can Ding was born in Shandong, China. He received the B.S. and M.S. degrees from Xi’an Jiaotong University, in 2005 and 2010, respectively, and the Ph.D. degree from the Huazhong University of Science and Technology. He is currently with China Three Gorges University. His research interests include high-voltage electric appliance and equipment.(Based on document published on 15 March 2019).

Publications

38

Citations

62

Publications by Year

20142025

Co-Authors:

Xing Chen
Xiwen Chen
Jiangbo Chen
Tianfan Chen
Cheng Chen

Show All Co-Authors (68)

Author's Published Works

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ETH Zürich, University of Würzburg(1)
Huawei Noah’s Ark Laboratory(1)
2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)(1)
IEEE(1)
New Orleans, LA, USA(1)
Alignment Module(1)
Attention Mechanism(1)
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Results

NTIRE 2022 Challenge on High Dynamic Range Imaging: Methods and Results

Eduardo Pérez-Pellitero;Sibi Catley-Chandar;Richard Shaw;Aleš Leonardis;Radu Timofte;Zexin Zhang;Cen Liu;Yunbo Peng;Yue Lin;Gaocheng Yu;Jin Zhang;Zhe Ma;Hongbin Wang;Xiangyu Chen;Xintao Wang;Haiwei Wu;Lin Liu;Chao Dong;Jiantao Zhou;Qingsen Yan;Song Zhang;Weiye Chen;Yuhang Liu;Zhen Zhang;Yanning Zhang;Javen Qinfeng Shi;Dong Gong;Dan Zhu;Mengdi Sun;Guannan Chen;Yang Hu;Haowei Li;Baozhu Zou;Zhen Liu;Wenjie Lin;Ting Jiang;Chengzhi Jiang;Xinpeng Li;Mingyan Han;Haoqiang Fan;Jian Sun;Shuaicheng Liu;Juan Marín-Vega;Michael Sloth;Peter Schneider-Kamp;Richard Röttger;Chunyang Li;Long Bao;Gang He;Ziyao Xu;Li Xu;Gen Zhan;Ming Sun;Xing Wen;Junlin Li;Jinjing Li;Chenghua Li;Ruipeng Gang;Fangya Li;Chenming Liu;Shuang Feng;Fei Lei;Rui Liu;Junxiang Ruan;Tianhong Dai;Wei Li;Zhan Lu;Hengyan Liu;Peian Huang;Guangyu Ren;Yonglin Luo;Chang Liu;Qiang Tu;Fangya Li;Ruipeng Gang;Chenghua Li;Jinjing Li;Sai Ma;Chenming Liu;Yizhen Cao;Steven Tel;Barthelemy Heyrman;Dominique Ginhac;Chul Lee;Gahyeon Kim;Seonghyun Park;An Gia Vien;Truong Thanh Nhat Mai;Howoon Yoon;Tu Vo;Alexander Holston;Sheir Zaheer;Chan Y. Park

2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2022 | Conference Paper |

Cited by: Papers (29)

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This paper reviews the challenge on constrained high dynamic range (HDR) imaging that was part of the New Trends in Image Restoration and Enhancement (NTIRE) workshop, held in conjunction with CVPR 2022. This manuscript focuses on the competition set-up, datasets, the proposed methods and their results. The challenge aims at estimating an HDR image from multiple respective low dynamic range (LDR) ...Show More

NTIRE 2022 Challenge on High Dynamic Range Imaging: Methods and Results

Eduardo Pérez-Pellitero;Sibi Catley-Chandar;Richard Shaw;Aleš Leonardis;Radu Timofte;Zexin Zhang;Cen Liu;Yunbo Peng;Yue Lin;Gaocheng Yu;Jin Zhang;Zhe Ma;Hongbin Wang;Xiangyu Chen;Xintao Wang;Haiwei Wu;Lin Liu;Chao Dong;Jiantao Zhou;Qingsen Yan;Song Zhang;Weiye Chen;Yuhang Liu;Zhen Zhang;Yanning Zhang;Javen Qinfeng Shi;Dong Gong;Dan Zhu;Mengdi Sun;Guannan Chen;Yang Hu;Haowei Li;Baozhu Zou;Zhen Liu;Wenjie Lin;Ting Jiang;Chengzhi Jiang;Xinpeng Li;Mingyan Han;Haoqiang Fan;Jian Sun;Shuaicheng Liu;Juan Marín-Vega;Michael Sloth;Peter Schneider-Kamp;Richard Röttger;Chunyang Li;Long Bao;Gang He;Ziyao Xu;Li Xu;Gen Zhan;Ming Sun;Xing Wen;Junlin Li;Jinjing Li;Chenghua Li;Ruipeng Gang;Fangya Li;Chenming Liu;Shuang Feng;Fei Lei;Rui Liu;Junxiang Ruan;Tianhong Dai;Wei Li;Zhan Lu;Hengyan Liu;Peian Huang;Guangyu Ren;Yonglin Luo;Chang Liu;Qiang Tu;Fangya Li;Ruipeng Gang;Chenghua Li;Jinjing Li;Sai Ma;Chenming Liu;Yizhen Cao;Steven Tel;Barthelemy Heyrman;Dominique Ginhac;Chul Lee;Gahyeon Kim;Seonghyun Park;An Gia Vien;Truong Thanh Nhat Mai;Howoon Yoon;Tu Vo;Alexander Holston;Sheir Zaheer;Chan Y. Park

2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)

Year: 2022 | Conference Paper |

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