CraftRGP: A Comprehensive Reliability Analysis Framework Towards ReRAM-Based Graph Processing

The burgeoning proliferation of graph data has rendered graph processing within conventional von Neumann computing architectures increasingly inefficient. Resistive Random Access Memory (ReRAM) emerges as a promising solution to circumvent the "memory wall" bottleneck encountered in graph processing. Nevertheless, the inherent non-idealities of ReRAM devices raise reliability concerns, the ramifications of which for graph processing necessitate a comprehensive exploration. In this work, we propose CraftRGP, a Comprehensive Reliability Analysis Framework Towards ReRAM-Based Graph Processing. CraftRGP simulates the operation of graph processing on ReRAM devices at the underlying hardware level, and employs software fault injection to simulate three primary fault models on ReRAM devices: permanent faults, transient faults, and sensing faults. Based on CraftRGP, we systematically evaluate the fault resilience of ReRAM-based graph processing along the dimensions of graph applications, fault models, and hardware architectures. Finally, utilizing the observed reliability characteristics with CraftRGP, we exemplify two use cases to demonstrate that CraftRGP can guide system designers to facilitate better reliability designs.