A DRAM Chip Protection Method Against EMFI Based on PHOTON Hash

Recent studies have shown that electromagnetic fault injection (EMFI) attacks can lead to multi-bit faults in DRAM, threatening the security of memory chips. Check codes are widely used to detect the occurrence of faults and to store and transmit information. However, in dealing with the problem of multi-bit faults, classical check codes, like ECC code and parity check, face the risk of failure. Therefore, in this paper, a new error check method based on a lightweight hash function named PHOTON hash is proposed to detect multi-bit faults caused by EMFI in DRAM. Compared with traditional error check methods, the proposed method can effectively detect the occurrence of multibit faults. In order to verify the effectiveness of the proposed method, a simulated fault injection experiment is carried out. The experimental results show that this method can effectively reduce the success rate of fault injection.