Ph.D. Project: ManAge: A Tool for Timing Characterization of FPGAs

Recent advancements in transistor scaling have intensified reliability concerns in semiconductor devices. Addressing these issues requires a thorough understanding of the electrical properties of resources within the chip. This paper presents ManAge, a tool tailored for FPGA characterization with sub-picosecond timing resolution. ManAge offers an automated workflow spanning from generating test schemes to FPGA testing and data processing.