Performance evaluation of the ADR1000 low-noise zener IC

This paper describes the performance results of the new ADR1000 thermally stabilized zener voltage reference IC from Analog Devices. Evaluation includes low-frequency noise, temperature coefficient, short-term and long-term drift measurements over the initial 588 days of continuous operation. Analysis included verification of the experimental setup employing an opposition zener array to maintain low uncertainty. Test circuit design, methods of the measurements and the uncertainty contributors are detailed in the paper. A noise reduction method by passive multi-cells zener array combination has also been tested. This comprehensive dataset provides valuable information to aid the development of the next generation of digitizers, voltage and current sources for electrical metrology applications.