Electronic Element Parameter Estimation of Amplifier Circuit using Regression Algorithms

This paper discusses the pivotal role of integrated circuits (ICs) in contemporary electronic devices and the component error issues they encounter. ICs facilitate the rapid advancement of electronic technology through a high degree of integration; however, the intricate fabrication process and delicate operations during manufacturing lead to component errors, which have become an urgent challenge in the testing domain. To address this, the paper proposes a novel test scheme based on S-parameters and regression algorithms. This approach measures S-parameters through computer-aided virtual simulation technology and a network analyzer, and combines various common regression algorithms to predict the parameters of the circuit components. A comparative analysis of these algorithms is conducted, laying the foundation for subsequent testing of circuit components.