Toward Free Space Local Characterization Method in Microwave

An electromagnetic jet operating at 30 GHz is examined in this article to detect, image, and characterize a material with high precision. First, we show the jet's characteristics, such as the high intensity of the focused beam, the FWHM below the diffraction limit, and the plane form of the wavefront at the focal point. Secondly, we use these properties to study the electromagnetic jet's ability to detect small objects relative to wavelength. Furthermore, the investigation was also carried out to analyse the spatial resolution of the jet in order to identify two adjacent tiny objects. Finally, we introduced the possibility of the electromagnetic jet to characterize materials locally in the plane wave approximation.