I. Introduction
Temperature operation is a critical aspect of icing the dependable operation and life of electronic systems. The capability to directly prognosticate and control temperatures in real-time is essential for precluding thermal issues similar to overheating, which can lead to performance declination, element failure, and reduced lifetime of electronic bias [1]. Traditional approaches to temperature vaticination in electronic systems frequently calculate on drugs-grounded models or empirical ways, which may warrant delicacy, scalability, and rigidity to dynamic operating conditions.