Photon Emission Modeling and Machine-Learning Assisted Pre-Silicon Optical Side-Channel Simulation

Optical side-channel analysis poses a significant threat to the security of integrated circuits (ICs) by enabling the disclosure of secret data, such as encryption keys. In this paper, for the first time, we present a multiphysics simulation framework of optical side-channel analysis from the layout database of a fabricated testchip. By leveraging accurate device models and electro-photonic physics, our framework models the photon emission behavior in ICs and enables the statistical correlation of emitted photon patterns with secret keys. Our framework enhances understanding of layout-level optical side-channel leakage and its implications, enabling IC designers to assess the risks associated with optical side-channel attacks and develop efficient countermeasures at the pre-silicon stage.