Minimization of Electric field Stress in Three phase gas insulated busduct with FGM bulb type spacer using metal inserts under Void defect

The continuity of the power system network is critical and should be guaranteed regardless of environmental conditions. Spacer failures of Gas Insulated Busducts (GIB) have recently been associated with several manufacturing and switching issues, such as delamination, protrusion, void, depression, gap, etc. Due to the de-energization of the gas-insulated busduct device and the significant financial loss caused by these defects, the insulator’s surface is significantly affected. This work investigates the electric field stress at the Triple Junction of a three phase GIB with void anomaly utilising a Functionally Graded Material (FGM) Spacer. Metal inserts (MI) fastened to the enclosure’s end help to alleviate tension. In order to produce uniform electric field stress, functionally graded materials are doped with a range of filler materials with different permittivity values and then dispersed spatially. The simulation is run using a spacer that is customised for various voltages and FGM gradings. The influence of grading on field stress is recognised and is further reduced when the $M I$ is introduced to the FGM insulator. The acquired data is examined and reviewed in order to prove that the proposed insulator can work.