Enhanced Data Pattern to Detect Defects in Flash Memory Address Decoder

A new unified Flash data background, namely the Enhanced BIU_DATA_TRANS pattern, is introduced, by incorporating physical diagonal pattern concept into the existing BIU_DATA_TRANS pattern, to test speed-related compliance of the Flash read path, with robust transitional fault detection for both address and data transitions. Compared to the prior art, the new enhanced pattern is able to detect defects in Flash memory address decoder effectively, as well as maintaining all possible data bit transitions for every bit pair. It is cost effective, i. e. it requires only 1 program/erase cycle to program the performance background, with minimal test cost for Flash read transition fault testing, and easily portable to any other products with embedded Flash memory.