Power-Aware Testing in the Era of IoT

IoT devices are increasingly employed in various applications. Due to their intrinsic power supply limitation, IoT devices are usually designed with extremely low functional power dissipation. However, the testing of IoT devices has become a big challenge, especially due to the excessive power dissipation during scan testing. This paper highlights the impact of excessive scan test power and points out the importance of power-aware testing for IoT devices.