Free-Space One-/Two-Port Calibration Using Planar Offset Short for Material Parameter Measurement

Free-space one-/two-port calibration methods using planar offset short for a material measurement are reviewed and validated by comparing the scattering parameters of a glass plate of 2.780 mm thickness measured from the two methods and the thru-reflect-line (TRL) method in the W-band (75-110 GHz).