System-level Uncertainty Quantification from Component-level Radiation Effects

The impacts of transistor-level total ionizing dose on system-level parameters of a CubeSat computing board are simulated. The temperature control loop simulation and uncertainty quantification shows TID-induced changes as probability distributions of key system performance parameters versus mission time.The impact of total ionizing dose (TID) effects on semiconductor components is well understood and often characterized by probability distributions of parametric changes. However, the propagation of such probabilistic changes to system-level performance parameters is needed. This paper presents an approach based on uncertainty quantification and system-level functional simulation that addresses this need and produces probabilistic predictions for performance degradation as functions of TID and thus mission time.