Failure Mode, Mechanism, and Effect Analysis of Visible Light Camera in an Optoelectronic Pod

Common photoelectric pods often have composite photoelectric sensing functions, such as visible light-sensing components, infrared night vision components, distance sensing components, etc. Among them, visible light sensing component is the most basic and widely used image sensing component. With the rapid development of modern optoelectronic technology, the reliability level of a visible light camera has become to be one of the most critical technical requirements in an optoelectronic pod, which greatly determine the success of a mission. For the entire equipment, the optoelectronic pod is like the eye of human beings. Once it fails, it may bring a devastating threat to the safety of the entire equipment and the performance of one task. This paper focuses on the reliability analysis of the visible light camera used in the optoelectronic pod. Through the analysis of its internal structure and performance indicators, the key and weak design links are obtained, which can provide important theoretical support for the reliability design of optoelectronics.