A self-referenced on-chip jitter BIST with sub-picosecond resolution in 28 nm FD-SOI technology

This paper describes an on-chip instrument for the estimation of absolute and period random jitter of clock signals in the GHz range with a sub-picosecond resolution. A self-referenced technique is used to remove the need of a very clean external reference clock. The instrument has been designed in STMicroelectronics 28 nm FDSOI technology. By exploiting the fine delay control which can be achieved with this technology, simulation results haven shown a resolution down to 100 fs for GHz clock signals with a simple calibration procedure. The instrument meets the requirement of a small footprint while using a standard digital test interface to transfer data. It can be configured in different ways to suit the resolution and frequency of operation requirements.