Non-Destructive Dielectric Measurement and Mapping Using Microwave holography

The dielectric characteristics of objects greatly impact microwave irradiation from them, providing important information for microwave remote sensing interpretation and applications. This research describes laboratory observations of the non destructive dielectric mapping and imaging of objects at X-Band frequency using microwave holography in transmission mode. The recorded complex phase information is used to calculate the dielectric permittivity of the object. The setup is used to map and measure the dielectric constant of known Acrylonitrile butadiene styrene (ABS) material in different shapes and positions. The measured properties are compared with the dielectric values measured by the standard Nicolson Ross Weir (NRW) method with the measurement error of ~2.2%. The agreement of results validate the use of proposed holographic setup in mapping and estimation of dielectric properties of materials.