I. Introduction
Due to its scalability, non-volatility and multi-level capability, Resistive Random Access Memory (RRAM) is a promising emerging technology for embedded memory applications. It’s scalability allows the integration into different technology nodes, the non-volatility can be taken advantage of in low-power applications and the multi-level capability enhances memory density. Further research is done to improve these properties to further develop RRAM technology [1]–[4]. But besides the technological integration, concepts and circuits for integration on system level are necessary to enable the utilization of these well suited properties. This includes handling of analog forming, read and programming operations as well as a complete digitization and possibility for automation, to reliably embed RRAM in sophisticated systems. There exists a wide variety of different RRAM technologies with diverse structure and electrical behavior [5] [6]. Therefore, a general concept for RRAM integration must be suitable for different technologies, which have different circuit demands due to a variety of resistance ratios, high resistance state (HRS) and low resistance state (LRS) resistances, read and programming voltages or forming methods. Nevertheless, the one-transistor one-resistor configuration (1T1R) is widely common for embedded RRAM memory designs, due to the flexibility, the selection transistor provides. The presented mixed-signal circuit offers a fully digital interface, that enables system designers to utilize the key advantages of 1T1R RRAM technology, while performing the analog forming, programming and read operations internally. By tuning a small amount of components, the circuit can be adapted to other technologies with different electrical properties.