Combining Fast Field Probes with an EMI Detector to reveal Bit Errors induced by ElectroMagnetic Disturbances

In this paper, the combination of fast field probes with a previously proposed Electromagnetic Interference (EMI) detector for detecting bit errors in wired communication channels is investigated. This paper studies two EMI detector designs: the Field Probe (FP) EMI detector and the Field Probe Adder Substractor (FPAS) EMI detector. The FP EMI detector solely employs field probes for detection, whereas the FPAS EMI detector uses field probes in addition to the previously proposed A&S EMI detector. The FPAS design overcomes the shortcomings of both the FP EMI detector and the A&S EMI detector by combining their functionality. In order to validate the functionality of the proposed EMI detectors, four distinct PCB-based communication channels are modelled and characterized in the reverberation chamber. These PCB models are intended to represent four types of communication channels. The results show that the proposed FPAS EMI detector can significantly reduce channel false positives in the considered cases.