Quantify Device EM Reliability Using Weibullian “k-out-of-N” Redundant System with Load Sharing

This paper presents a novel method of quantifying “k-out-of-N” system reliability with large number of Weibullian redundant load-sharing EM-failure-governed components using Monte Carlo simulation method. The derived model and proposed method have wide range of industry applications in both microelectronics and other large redundant systems with load sharing.