I. Introduction
Electroplated copper is the interconnect material for build-up of micro-nano scaled electronic circuits in integrated circuits manufacturing and packaging [1], [2]. Generally, copper electroplating demand for controllable growth morphology and minimal impurity defects. As advances of miniaturized interconnect structures and increased package density, it further demand for superior microstructural thermostability, mechanical strengthening-toughening, electromigration resistance, etc., which are closely related to the lattice orientation, grain size, and grain boundary characters of electroplated copper [3].