1. Introduction
Memory devices used on space applications are susceptible to a variety of Single Event Effects (SEE) caused by the impact of ionizing particles. This susceptibility depends on the memory type, manufacturing, and the existence of a solar event (and if so, on its magnitude and duration). Single Event Upsets (SEU) are a type of SEE that is non-permanent and that “can change the value stored in one or in more memory locations” and that does not interrupt the normal operations of the device, “even if the data stored in the location hit by the particle are corrupted [1].” Unlike SEUs, a Single Event Functional Interrupt, or SEFI, is a type of upset in memory devices that leads “to a temporary non-functionality (or interruption of normal operation) [2]”. While typical SEUs cause errors that are spread out across the memory, a SEFI typically manifests by a flurry of errors in consecutive addresses in memory.