Experimental Study of the Effect of Temperature Dependent Charging on the Evolution of the Eey of SiO2 Thin Films

Low energy electrons up to some keV may cause Multipactor breakdowns in RF devices [1] , driven by the Electron Emission Yield (EEY) of the materials. Insulators are often found in these components, however they can increase the multipactor effect or be subject to dielectric breakdown. Hence the knowledge of the EEY and charge buildup in insulators is crucial.