Screening of LEDs by the Results of Accelerated Tests Under the Action of Pulsed Current

The results of investigations of the decrease in the luminous flux of emission of blue InGaN LEDs during tests at a constant current with a density of 35 A/cm
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, previously exposed to a test exposure of a pulsed current with a density of 100 A/cm
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for 1, 2, 5, 10 and 20 h, respectively, are presented. It is shown that the test exposure of a pulsed current of increased density, which does not lead to the destruction of the structure, makes it possible to identify and reject LEDs with an abnormally high rate of change in the luminous flux at the initial stage of current tests and, thereby, equalize the degradation rate of LEDs in the sample.