Autocalibration Approach for Improving Robustness of Analog ICs

This work presents a dedicated method of analog integrated circuit (IC) autocalibration, which was used to calibrate a voltage reference with the output voltage value of 96 mV . The reference accuracy might be significantly influenced by fluctuations in the manufacturing process. The essence of this technique is to suppress this undesired influence of process variations in terms of the corner conditions of 130 nm CMOS technology. All analog parts of the proposed autocalibration system are presented at the transistor level. The output of the calibration subcircuit is a digital signal controlling the autocalibration.

I. Introduction

The trend towards requirements for IC design has not changed for many years, it includes: increasing the computing power of ICs, and at the same time, reducing their energy consumption and area. This means focusing on a low-voltage IC design and increasing the density of circuit elements (CEs) integration. Both the above-mentioned aspects are caused by scaling down the dimensions of CEs and have a significant impact on the design of analog ICs in particular [1].