Reliability Analysis of Physically Unclonable Function by Using Aging Variability Simulation

We applied Monte Carlo (MC) aging simulation flow to explain measured aging effects of PUF (Physically Unclonable Function) circuit. Simulation data provides a good understanding of how PUF circuit stability is degraded with the NBTI effect. Procedure of using MC aging simulation flow to predict PUF stability is explained in detail. Result from simulation is well matching with the measured data when the variability model is correctly extracted considering MOSFET device size. This flow was used to predict the stability of different types of PUF designs.