Dual-Components Magnetic Probe for Electromagnetic Interference Measurement

In this paper, a dual-components magnetic probe which can measure the magnetic fields
$H_{x}$
and
$H_{y}$
at the same time is proposed. The dual-components probe saves lots of scanning time when one need to measure both
$H_{x}$
and
$H_{y}$
in electromagnetic interference measurement. Its working frequency ranges from 20MHz to 6GHz. The probe is designed based on a four-layered printed circuit board. The simulation and measurement results show that the sensitivity of the fabricated probe is high, and even higher than the commercial single component magnetic probe.