Reliability Evaluations of SiCr Resistors in BCD IC Technologies

Silicon-Chromium (SiCr) precision resistors are a stable alternative to poly-silicon resistors for use in power analog and automotive products. The reliability of these resistors is dependent upon the composition, applied power, and other factors. Determining the resistor failure mechanism is difficult due to Joule Heating, and a pulsed current stress test has been used to determine the safe operating current density of the devices. Power density is shown to be a primary factor, indicating affecting the resistor stability, indicating a physical change with temperature may be the primary reliability concern.