Impact of Lorentz Force On Atomic Flux During Electromigration

A new model for atomic flux during electromigration is proposed. It includes the effect of magnetic field on migrating ions. The magnetic field is generated by flow of electrons elsewhere in the conductor. Lorentz forces acting on migrating lattice ions due to the magnetic fields are combined with electron wind force and the stress gradient to derive a new model for atomic flux. An estimation of the Lorentz forces on migrating ions for typical conditions is calculated and conditions under which the new model might be significant for electromigration damage and lifetime are presented.