Impact of On-Wafer Probe on the Radiation Measurement of a Filtering Antenna-in-Package

The impact of the on-wafer probe on the radiation measurement of a filtering antenna-in-package (AiP) is analyzed. The filtering AiP operates in 26.6 to 29.2 GHz with high out-of-band rejection. It is found that the measured out-of-band gain response and radiation patterns are affected significantly by the on-wafer probe. The large deviation between the simulated and measured results comes from the probe radiation, which can be considered by modeling the probe in simulations. A method is proposed to predict the radiation characteristic of the probe terminated arbitrarily and evaluate its impact on the measured out-of-band radiation performance of the AiP under test.