Study on the Factors of Start-up White Line Caused by Coupled Electric Field in TFT LCD

In this paper, we report on the factors of Start-up White Line defect caused by coupled electric field. The defect appeared near the Gate signal line of the display area at zero gray step of the start-up sequence. The failure mechanism was found out to be the coupled electric field caused by the voltage difference between the Common and Gate-Low signals. It affected the charge density in the surrounding Black Matrix and created a new electric field which disturbed the deflection of the liquid crystal. Further experiments and analysis showed that the failure was related to the voltage difference between the common and Gate-Low signals, the resistance of Black Matrix, the pattern of Black Matrix.