MIPI RFFE functional leakage failure debug using an integrated NI-PXIe setup

As communication networks progress into 5G and mmWave spectrum, modern RF systems have become highly sophisticated with multiple high-performance RF front-end modules integrated within. MIPI RFFE protocol defines the standard for configuring, communicating with and also testing the RF front-end modules. Therefore, proficiency in MIPI protocol and being able to manipulate the test patterns plays a significant role in failure characterization and debug. Conventional static debug approach of biasing the power, ground and relevant control pins is not fruitful anymore. On the other hand, setting up of probe card and tester based dynamic fault isolation capabilities is also not a cost-effective solution for RFFE leakage failures due to their low pin count and frequency requirements. In this paper, a semi-dynamic approach is adopted by integrating National Instruments’ PXIe system to either a manual bench station for testing or a static fault isolation system for debugging RFFE functional leakage failures. Segmented pattern analysis has been demonstrated to be effective in failure validation and failure characterization. This paper describes two case studies where NI-PXIe setup together with detailed MIPI protocol understanding led to successful debug of low yield and new product prototype MIPI leakage failures.