Design of Defocus Binary Pattern Based on Genetic Algorithm and Tabu Search

The binary defocusing technique has enabled speed breakthroughs for 3D shape measurement, yet simultaneously achieving high accuracy and high speed remains difficult. To overcome this limitation, this paper proposes a binary pattern optimization algorithm based on Genetic Algorithm and Tabu Search. Firstly, the relative phase is obtained by defocusing the binary pattern through the projector to avoid the influence of the gamma effect on the phase quality. Secondly, for reducing the influence of the projector's defocus on the Gray code phase unwrapping, a complementary combined Gray code method is proposed, which can accurately unwrap the phase. The experimental results show that the method in this paper improves the three-dimensional measurement results of the digital fringe projection technology and improves the robustness.