Graphene-based thin-films for flexible applications inspected by high-resolution Terahertz near-field inspection

Terahertz (THz) inspection is among the most versatile tools to perform non-destructive, quantitative characterization of conductive thin-films. In this work we apply high-resolution THz near-field measurements for the inspection of graphene-based thin-films for flexible applications. We show and discuss sheet resistance results for wafer-scale CVD-grown graphene as well as for conductive thin-films produced from dispersions of exfoliated graphene-flakes on various substrates.