Design and Optimization of the Dual-Band Negative Group Delay Circuit Based on Taguchi Method

In this paper, A defected microstrip structure (DMS) design is presented for dual-band negative group delay circuit (NGDC). The frequency and group delay of each band are influenced by DMS. To promise the match of the goal frequencies, Taguchi Method (TM) is chosen to optimize the NGDC. To validate the design concept, a prototype of this NGDC has been designed, optimized, simulated and fabricated. Its electromagnetic and circuit-simulated results agree well. From the measurements, at 3.4 GHz and 5.0 GHz, the negative group delay (NGD) values are achieved -3.5 ns and -6.5 ns respectively.