Design of Microstrip Line used for Probe Calibration up to 40 GHz

With the rapid development of 5G communication, the electromagnetic interference (EMI) becomes more serious than before. For the EMI diagnosis, there is a great demand for the magnetic probe working at millimeter-waves. The design of two low-cost kinds of microstrip lines used for probe calibration up to 40 GHz are proposed in this paper. Their features, including S parameter and working field components, are both presented in detail. Both numerical and physical results verify the effectiveness of these two structures which can be used to calculate the correct probe factor at a high frequency.