Defect Detections of Polymers Materials Based on Bi-Material Microcantilever FPA at 3.1THz

This paper reports defect detections of polymers based on bi-material microcantilever focal plane array (FPA) at 3.1 terahertz (THz). The FPA was realized by integrating the metamaterial absorbers (MAs) into a bi-material microcantilever, which thermomechanical sensitivity was measured to be 3.86 µm/K. An imaging system was then established by a parabolic mirror group for THz beam collimation and expansion, which can decrease the THz energy loss by about 44% compared with traditional lenses. The proposed system together with the fabricated FPA realizes defect detections of different polymers at room temperature with a resolution of 1mm.