Comparison of the Measurement Accuracy of Material Sample Specular Reflection Coefficient for Two Types of Measuring Facilities

The paper presents the results of experimental and numerical studies of the reflection coefficient dependence on the plane wave incidence angle in the bistatic scheme with two movable antennas and in the monostatic scheme with dihedral corner reflector. Measurements were realized for a planar magnetodielectric sample at two experimental facilities. Numerical simulations were carried out by the method of moments in FEKO program in the setting of two measurement schemes in order to used technique error detection for samples. The results were compared with each other and with the analytical calculations obtained by Fresnel formulas. It is shown that measurements with dihedral reflector gave more noticeable deviations from the analytical calculations than data, obtained on the bistatic facility. The conclusions drawn in this paper on the base of simulation results of samples, are applicable to any experimental facilities for the study of plane materials and coatings.