Automated Dysfunctional Model Extraction for Model Based Safety Assessment of Digital Systems

In the field of automatic quality or safety assurance level evaluation, this paper proposes the first approach towards the automation of the extraction processes of both the valid and faulty state machines within a System-on-a-Chip. The data automatically extracted by this method is a relevant input for behavioural modelization and FMEA analysis. The method is based on a semi-automated approach for the systematic extraction of failure modes of a digital design in the hypothesis of a single-event upset (SEU) or stuck-at in flip-flops. This procedure aims to enhance human driven failure analysis and provide inputs for RAMS frameworks in the process of quality assurance of complex devices. The main objective is to transport and apply RAMS methods and tools in the area of SoCs design. Experimental results have been conducted on an I2C - AHB system, laying the base for a complete and more complex analysis on an entire SoC.