Research on thermo-electric degradation tests based on polyimide degradation data

Product reliability modeling and remaining life prediction based on degradation data are research hotspots and focuses in the field of reliability engineering. In this paper, based on the univariate linear Wiener process, combined with the generalized Eyring model, a life-stress model is proposed, and the reliability of polyimide film is evaluated by accelerated degradation tests under the thermo-electric stress. This method effectively verifies the average life of the polyimide film and greatly reduces the test time and test cost.