Variations of Corner Effects in Junctionless Fin-Body FETs

The corner effect is a type of leakage current due to which the performance of the device is degraded. In this paper, the Corner effects of the Junctionless Fin-Body FETs have been investigated using a TCAD simulator. This paper mainly observes that these corner effects vary with the physical parameters of the device like effective oxide thickness and body concentration. By identifying the changes in the corner effects with physical parameters, we can able to optimize the device for better performance.