Review of Near-Field EMI Measurement

In this paper, the near-field electromagnetic interference (EMI) measurement technology is summarized. Based on it, the source reconstruction method is used to simplify the complex EMI source modeling. A multi-components probe is developed to save the valuable testing time. The near-field measurement show several advantages over the traditional far-field measurement methods due to its low-cost and ability to detect weak radiations, especially for the shielding effectiveness measurement of smaller devices.