High Current Event and Single Event Functional Interrupt in Non-Volatile Memories

Complex events such as High Current Event and Single Event Functional Interrupt were observed on different non-volatile memories in a radiative environment. Indeed, ionizing particles can strongly impact the behavior of the devices. The purpose of this work was to characterize precisely these complex events and to assess their impact on the operability of the devices. The correlation between losses of functionality and over-power consumption was also studied in order to investigate some mitigation techniques for in-flight conditions.